The TESCAN CLARA is an ultra-high-resolution scanning electron microscope (SEM) located at the Interdisciplinary Nanoscience Center (iNANO) at Aarhus University. This state-of-the-art instrument provides advanced imaging and analytical capabilities for the detailed characterization of a wide range of materials. The CLARA SEM offers high-contrast, field-free imaging, making it particularly suitable for nanoscale investigations in materials science, nanotechnology, and life sciences. Equipped with a multi-detector system, it enables researchers to selectively collect electrons for enhanced imaging contrast and detail.
The SEM is an essential tool for iMAT’s research activities, supporting high-resolution imaging, compositional analysis, and structural characterization of advanced materials. Its capabilities make it ideal for applications ranging from nanostructure examination and thin-film analysis to battery materials research and biological sample imaging.
Furthermore, the SEM CLARA supports various advanced imaging and analysis techniques, including:
Have a look at the description of SEM on the iNANO website.
The SEM Clara has been utilized by multiple iMAT-affiliated researchers for advanced materials characterization. Some of the users include:
Prof. Bo B. Iversen, Prof. Dorthe Ravnsbæk, Asst. Prof. Shuai Wei
Prof. Shweta Agarwala, Asst. Prof. Rasmus Schmidt Davidsen
Prof. Duncan Sutherland, Asst. Prof. Espen Drath Bøjesen
Prof. Anders Bentien
Andreas Østergaard Drejer, Bettina Pilgaard Andersen, Dorthe Bomholdt Ravnsbæk
Dr. Lasse N. Skov, Dr. Jakob B. Grinderslev, Therese S. S. Kjær, Lasse R. Kristensen, Prof. Torben R. Jensen
Amalie P. Laursen, Jens P. Frandsen, Priyank Shyam, Mathias I. Mørch, Frederik H. Gjørup, Harikrishnan Vijayan, Mads R. V. Jørgensen, Mogens Christensen
The acquisition of the TESCAN CLARA SEM was made possible through support from the Carlsberg Foundation and iMAT. The EBSD detector was acquired by a member through a research infrastructure Carlsberg grant.
